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Analysis and Design of Analog Integrated Circuits, 4th Edition
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In this Fourth Edition of Analysis
and Design of Analog Integrated Circuits, Paul Gray and Robert Meyer have
teamed up with two new coauthors-Paul Hurst and Stephen Lewis-to provide a current,
comprehensive, and in-depth treatment of analog integrated circuit analysis and
design. The authors combine bipolar, CIVICS, and BiCMOS analog integrated-circuit
design into a unified presentation that stresses their commonalties and highlights
their differences. Readers will gain valuable insights into the relative strengths
and weaknesses of these important technologies.
The Fourth Edition features new and expanded coverage of several
key technologies and techniques, including increased emphasis on CMOS circuits
in Chapters 3 - 7; a new chapter covering fully differential amplifiers and
commonmode feedback; new material on feedback circuit analysis using return
ratio in addition to the two-port feedback analysis; and new coverage of two-stage
MOS op-amp compensation, single-stage op amps, and nested Miller compensation.
- Coverage of cutting-edge topics. The new edition features
more advanced CMOS device electronics, including short-channel effects, weak
inversion and impact ionization.
- State-of-the-art IC processes. The text shows how
modern integrated circuits are fabricated, including recent issues like heterojunction
bipolar transistors, copper interconnect, and low permittivity dielectric
materials.
- Unified treatment of bipolar and CMOS Circuits. This
format takes readers through each step in designing real-world amplifiers
in silicon.
- Open-ended design problems. A number of open-ended
design problems, included in the problem sets, exposes the reader to real-world
situations where a range of circuit solutions may be found to satisfy a given
performance specification.
- Extensive use of SPICE. SPICE is an integral part
of many examples in the problem sets.
Table
of Contents
- Symbol Convention
- Models for Integrated-Circuit
Active Devices
- Introduction
- Depletion Region of a
pn Junction
- Large-Signal Behavior
of Bipolar Transistors
- Small-Signal Models of
Bipolar Transistors
- Large-Signal Behavior
of Junction Field-Effect Transistors
- Small-Signal Model of
the JFET
- Large-Signal Behavior
of Metal-Oxide Semiconductor Field-Effect Transistors
- Small-Signal Model of
the MOS Transistor in Saturation
- Short-Channel Effects
in FETs
- Subthreshold Conduction
in MOSFETs
- Substrate Current Flow
in MOSFETs Appendix
- Summary of Active-Device
Parameters
- Bipolar, Mos, and BiCmos
Integrated-Circuit Technology
- Introduction
- Basic Processes in Integrated-Circuit
Fabrication
- High-Voltage Bipolar
Integrated-Circuit Fabrication
- Advanced Bipolar Integrated-Circuit
Fabrication
- Active Devices in Bipolar
Analog Integrated
- Circuits
- Passive Components in
Bipolar Integrated
- Circuits
- Modifications to the
Basic Bipolar Process
- MOS Integrated-Circuit
Fabrication
- Active Devices in MOS
Integrated Circuits
- Passive Components in
MOS Technology
- BiCMOS Technology
- Economics of Integrated-Circuit
Fabrication
- Packaging Considerations
for Integrated
- Circuits Appendix
- Spice Model-Parameter
Files
- Single-Transistor and
Two-Transistor Amplifiers
- Device Model Selection
for Approximate
- Analysis of Analog Circuits
- Basic Single-Transistor
Amplifer Stages
- Two-Transistor Amplifer
Stages
- Emitter-Coupled Pairs
- Source-Coupled FET Pairs
- Device Mismatch Effects
in Differential Amplifiers
- Appendix
- Elementary Statistics
and the Gaussian
- Distribution
- Transistor Current Sources
and Active Loads
- Introduction
- Current Sources
- Current Sources as Active
Loads Appendix
- Matching Considerations
in Transistor
- Current Sources
- Supply-Independent Biasing
- Temperature-Independent
Biasing
- Low-Current Biasing
- Output Stages
- Introduction
- The Emitter Follower
as an Output Stage
- The Common-Emitter Output
Stage
- The Common-Base Output
Stage
- Class B (Push-Pull) Output
Stage
- Operational Amplifiers
- Applications of Operational
Amplifiers
- Deviations from Ideality
in Real Operational Amplifiers
- Analysis of Monolithic
Operational Amplifiers
- Design Considerations
in Monolithic Operational Amplifiers
- MOS Operational Amplifiers
Appendix
- Calculation of the Input
Offset Voltage
- and Current of the
- Input Offset Voltage
of MOS Op Amps
- Frequency Response of
Integrated Circuits
- Introduction
- Single-Stage Amplifier
Frequency Response
- Multistage Amplifier
Frequency Response
- Analysis of the Frequency
Response of the
- 741 Op Amp
- Relation Between Frequency
Response and Time Response
- Feedback
- Ideal Feedback Equation
- Gain Sensitivity
- Effect of Negative Feedback
on Distortion
- Feedback Configurations
- Practical Configurations
and the Effect of
- Loading
- Single-Stage Feedback
- The Voltage Regulator
as a Feedback Circuit
- Frequency Response and
Stability of Feedback Amplifiers
- Introduction
- Relation Between Gain
and Bandwidth in Feedback Amplifiers
- Instability and the Nyquist
Criterion
- Compensation
- Root-Locus Techniques
- Slew Rate
- Nonlinear Analog Circuits
- Introduction
- Precision Rectification
- Analog Multipliers Employing
the Bipolar Transistor
- Phase-Locked Loops (PLL)
- Nonlinear Function Synthesis
- Noise in Integrated Circuits
- Introduction
- Sources of Noise
- Noise Models of Integrated-Circuit
- Components
- Circuit Noise Calculations
- Equivalent Input Noise
Generators
- Effect of Feedback on
Noise Performance
- Noise Performance of
Other Transistor
- Configurations
- Noise in Operational
Amplifiers
- Noise Bandwidth
- Noise Figure and Noise
Temperature
- Index
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